Tag Archives: ASSET InterTech

eBook: Testing System Clocks with Boundary Scan (JTAG) and an FPGA

Testing System Clocks with Boundary Scan (JTAG) and an FPGA

ASSET InterTech published a new ebook that explains how cost-effective verification of system clocks during prototype circuit board bring-up and manufacturing can be accomplished with several different methods based on JTAG and boundary-scan testing or IP in an FPGA. The title of the ebook is Testing System Clocks with Boundary Scan (JTAG) and an FPGA.

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eBook: At-Speed SPI Flash/EEPROM Programming Using FPGA and JTAG

At-Speed SPI Flash/EEPROM Programming Using FPGA and JTAG

ASSET InterTech published a new ebook about the pros and cons of several different methods for programming memory devices connected to the Serial Peripheral Interface (SPI) bus. Each method takes advantage of a Field Programmable Gate Array (FPGA) that is already on the board for functional purposes. The title of the technical article is At-Speed SPI Flash/EEPROM Programming Using FPGA and JTAG.

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ASSET InterTech Debuts DDR2/DDR3 Memory Link Test Instrument, Memory Tester

ASSET InterTech block diagram of an embedded memory BIST instrument

ASSET InterTech introduced their DDR2/DDR3 memory link test instrument and a generic memory tester. The two new memory test instruments are the latest addition to the ScanWorks embedded instrumentation library for their FPGA-controlled test (FCT) circuit board test tool. ScanWorks FCT can temporarily or permanently embed the two instruments in a functional field programmable gate array (FPGA) on a circuit board. The DDR2/DDR3 memory link tester and generic memory instrument are available now.

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White Paper: FPGA-Controlled Test (FCT): What it is and why it is needed

ASSET InterTech published a white paper about a new method for validating, testing and debugging circuit boards by embedding a board-tester-in-a-chip. The title of the technical article is: FPGA-Controlled Test (FCT): What it is and why it is needed. The paper describes a method call FPGA-controlled test (FCT). FCT involves the automatic insertion of multiple embedded instruments into a field programmable gate array to function as a board tester. The embedded board tester is then operated from an intuitive drag-and-drop graphical user interface.

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ASSET InterTech ScanWorks FPGA-Controlled Test

ASSET InterTech announced their new ScanWorks FPGA-Controlled Test (FCT). With ScanWorks FCT, embedded instruments engineers can select the instruments they need, set their parameters and insert them into a field programmable gate array to function as a circuit board tester. Once inserted, ScanWorks FCT operates the board-tester-in-a-chip from a drag-and-drop user interface for validation, testing and debugging. The ScanWorks FCT tool will be available in December.

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