Microsemi is offering a webinar, Single Event Upset (SEU) Immunity in Terrestrial FPGA Applications. The webcast is intended for reliability engineers and FPGA designers focused on high-impact applications in medical, automotive, industrial, military and avionics segments. The online seminar will take place Thursday, September 8, 2011 from 9-10 a.m. PDT. A recorded version of the FPGA webinar and all presentation materials will be available after the event.
In this webinar, engineers will learn the difference between antifuse and flash and how to avoid reliability risks in choosing an FPGA. The FPGA webcast will discuss the use of SEU to combat integrated circuit malfunctions due to subatomic radiation particles in high-impact, terrestrial applications. This is an issue of increasing concern, particularly in applications where down-time is not an option, loss of communication is not acceptable, and loss of automation and control is not tolerated. Designers cannot afford to take risks with their FPGA devices.
Microsemi FPGA Webinar Topics
- Basics of Single-Event Effects
- Neutrons and Alpha Particles
- Flash vs. SRAM
- SEU in Medical, Avionics, Network and Infrastructure Applications
- Case Study
The online seminar will be presented by Minal Sawant, product marketer for medical, military and avionics in Microsemi’s SoC product group.
More info: Microsemi FPGA Webinar