ASSET InterTech Debuts DDR2/DDR3 Memory Link Test Instrument, Memory Tester

ASSET InterTech block diagram of an embedded memory BIST instrument

ASSET InterTech introduced their DDR2/DDR3 memory link test instrument and a generic memory tester. The two new memory test instruments are the latest addition to the ScanWorks embedded instrumentation library for their FPGA-controlled test (FCT) circuit board test tool. ScanWorks FCT can temporarily or permanently embed the two instruments in a functional field programmable gate array (FPGA) on a circuit board. The DDR2/DDR3 memory link tester and generic memory instrument are available now.

After engineers have selected the instruments they need to implement their non-intrusive board test strategy, ScanWorks FCT automatically configures, inserts, operates and subsequently removes the FPGA-based board tester. The tester-in-a-chip can be employed during design to accelerate the board bring-up process by validating early prototypes before firmware and software are available, during manufacturing to ensure the quality of assembled boards and later as a troubleshooting tool in field service. After it has been used, the ScanWorks FCT tester can be quickly removed and the FPGA’s functional firmware loaded.

Deploying ScanWorks FCT to perform memory test is an automated process. First, the instruments that will be embedded in a FPGA are selected from the ScanWorks instrument library. Next, the target FPGA is selected from another library of supported devices. Once the parameters have been set on the instruments, ScanWorks automatically generates the architecture of the embedded tester and facilitates the synthesis of the instrument code into a firmware image compatible with the target FPGA. ScanWorks then inserts the tester in the FPGA and subsequently serves as a drag-and-drop user interface to operate and manage the embedded tester. ScanWorks functions as a unified and automated environment for the entire process.

More info: ASSET InterTech