XJTAG introduced a 3U PXI (PCI eXtensions for Instrumentation) XJTAG module. The new PXI card features a high speed interface for the boundary scan chain. The board enables users of PXI chassis to leverage XJTAG’s ability to debug, test and program complex ball grid array (BGA) populated printed circuit boards and systems from within their integrated PXI test platform. Those running National Instruments’ LabVIEW software also get a full set of virtual instruments (VIs) to interface to the XJTAG system.
The XJTAG development system is a cost-effective solution for debugging, testing, and programming electronic printed circuits boards and systems. XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including BGA and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs and microprocessors.
PXI combines PCI electrical-bus features with the rugged, modular, Eurocard packaging of CompactPCI, and then adds specialized synchronization buses and key software features. PXI is both a high-performance and a low-cost deployment platform for measurement and automation systems. PXI systems serve applications such as manufacturing test, military and aerospace, machine monitoring, automotive, and industrial test.
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