The Single Event Effects (SEE) Symposium focuses on the understanding of radiation-induced SEEs in microelectronics and photonics. At the Single Event Effects Symposium, Actel take present a session. Actel will provide a comprehensive SEE characterization of the new mitigation solutions included in the latest DSP-intensive RTAX-DSP FPGAs. A comparison of SEE results for both RTAX-DSP and RTAX-S/SL FPGAs will be presented, and mitigation strategies will be discussed. The SEE Symposium will take place April 12-14 at the San Diego Marriott La Jolla.
Devices and ICs: Reconfigurable
SEE Characterization of the New RTAX-DSP Antifuse FPGAs
Tuesday, April 13, 2010, 5:00 PM
Presented by Sana Rezgui, Principal Engineer, Actel Corporation
RTAX-DSP is a flexible alternative to ASICs for the integration of complex DSP functions. In addition, its nonvolatile, radiation-tolerant programming technology has no requirement for external code storage devices and requires no mitigation of upsets in its configuration memory, unlike SRAM-based FPGAs. RTAX-DSP is based on the same architecture and 0.15 um process as Actel’s industry-standard RTAX-S/SL space-flight FPGAs.
Single event effects are a common cause of failures in space-flight systems unless steps are taken to mitigate their effects. SEEs occur when a single particle (neutron, proton or other heavy ion) interacts with the atoms that makeup a semiconductor. Some examples of these types of events are Single Event Upsets (SEU), Single Event Latchup (SEL), Single Event Gate Rupture (SEGR), Single Event Burnout (SEB), and others.
More info: Single Event Effects (SEE) Symposium